Precise Structural Analysis of Molecular Layer at Soft Interface II : X-ray Reflectometry
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چکیده
منابع مشابه
Direct structural observation of a molecular junction by high-energy x-ray reflectometry.
We report a direct angstrom resolution measurement of the structure of a molecular-size electronic junction comprising a single (or a double) layer of alkyl-thiol and alkyl-silane molecules at the buried interface between solid silicon and liquid mercury. The high-energy synchrotron x-ray measurements reveal densely packed layers comprising roughly interface-normal molecules. The monolayer's th...
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ژورنال
عنوان ژورنال: Oleoscience
سال: 2012
ISSN: 1345-8949,2187-3461
DOI: 10.5650/oleoscience.12.17